Inventor · Fremont, CA, US

Harish Nandyala

17Patents
3h-index
17Co-inventors
53Inventor score

Filing activity: Oct 30, 2009 → Apr 21, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US9960963B2 Dynamic client fail-over during a rolling patch installation based on temporal server conditions Electricity 26 Active
US9660987B2 Storage isolation using I/O authentication Electricity 3 Active
US10237252B2 Automatic creation and management of credentials in a distributed environment Physics 3 Active
US10387273B2 Hierarchical fault tolerance in system storage Physics 2 Active
US8924951B2 Embedding patch lists within compiled program code Physics 1 Active
US10346150B2 Computerized system and method for patching an application by separating executables and working data using different images Electricity 1 Active
US9009121B2 Bootstrapping server using configuration file stored in server-managed storage Emerging Cross-Sectional Technologies 1 Active
US8732521B2 Detection of logical corruption in persistent storage and automatic recovery therefrom Physics 1 Active
US11016865B2 Database-level automatic storage management Physics 0 Active
US10127054B2 Bootstrapping server using configuration file stored in server-managed storage Emerging Cross-Sectional Technologies 0 Active
US10353920B2 Efficient mirror data re-sync Physics 0 Active
US11847034B2 Database-level automatic storage management Physics 0 Active
US9852284B2 Storage isolation using I/O authentication Electricity 0 Active
US9892756B2 Detection of logical corruption in persistent storage and automatic recovery therefrom Physics 0 Active
US10049022B2 Systems and methods to retain and reclaim resource locks and client states after server failures Physics 0 Active
US9208038B2 Detection of logical corruption in persistent storage and automatic recovery therefrom Physics 0 Active
US9690597B2 Bootstrapping server using configuration file stored in server-managed storage General 0 Revoked

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.