Harsh Sinha
6Patents
2h-index
18Co-inventors
40Inventor score
Filing activity: Nov 28, 2012 → Aug 20, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9922269B2 | Method and system for iterative defect classification | Electricity | 3 | Active |
| US9898811B2 | Method and system for defect classification | Physics | 2 | Active |
| US10056224B2 | Method and system for edge-of-wafer inspection and review | Electricity | 2 | Active |
| US9318395B2 | Systems and methods for preparation of samples for sub-surface defect review | Electricity | 2 | Active |
| US9696268B2 | Automated decision-based energy-dispersive x-ray methodology and apparatus | Electricity | 1 | Active |
| US10770258B2 | Method and system for edge-of-wafer inspection and review | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.