Hidemitsu Ogawa
2Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Aug 24, 2000 → Jan 26, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6501553B1 | Surface profile measuring method and apparatus | Physics | 11 | Expired |
| US7852489B2 | Method for measuring surface profile, and apparatus using the same | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.