Hiroaki Yuda
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Feb 11, 2003 → Feb 11, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7149341B2 | Wafer inspection apparatus | Physics | 11 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.