Hiroshi Wakaba
4Patents
1h-index
6Co-inventors
27Inventor score
Filing activity: Oct 22, 2008 → Dec 1, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8497985B2 | Inspection method based on captured image and inspection device | Physics | 2 | Active |
| US8700498B2 | Feature analyzing apparatus for a surface of an object | Physics | 0 | Active |
| US8488867B2 | Inspection device for disk-shaped substrate | Electricity | 0 | Active |
| US8508246B2 | Substrate surface inspecting apparatus and substrate surface inspecting method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.