Hisaki Kozaki
2Patents
2h-index
4Co-inventors
30Inventor score
Filing activity: Apr 4, 2007 → Jul 8, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7573066B2 | Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus | Electricity | 58 | Active |
| US7973281B2 | Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus | Electricity | 58 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.