Hung van Pham
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Sep 2, 1986 → Sep 2, 1986
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4776695A | High accuracy film thickness measurement system | Physics | 31 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.