Jae-Man Oh
1Patents
0h-index
5Co-inventors
19Inventor score
Filing activity: Apr 23, 2018 → Apr 23, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10393672B2 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.