Inventor · Houston, TX, US

Jared Joseph Stackman

1Patents
0h-index
4Co-inventors
19Inventor score

Filing activity: Oct 31, 2018 → Oct 31, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US11918942B2 In process screen parameter measurement and control Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.