Jasper Menger
10Patents
3h-index
12Co-inventors
53Inventor score
Filing activity: Mar 8, 2011 → Aug 10, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9946165B2 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Physics | 13 | Active |
| US10274834B2 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Physics | 10 | Active |
| US10642162B2 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Physics | 4 | Active |
| US10495990B2 | Methods and apparatus for calculating substrate model parameters and controlling lithographic processing | Physics | 1 | Active |
| US11940740B2 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Physics | 1 | Active |
| US11300891B2 | Methods and apparatus for calculating substrate model parameters and controlling lithographic processing | Physics | 0 | Active |
| US11385550B2 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Physics | 0 | Active |
| US8972031B2 | Control method and apparatus | Physics | 0 | Active |
| US12287584B2 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Physics | 0 | Active |
| US10859930B2 | Methods and apparatus for calculating substrate model parameters and controlling lithographic processing | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.