Jennming Chen
3Patents
3h-index
12Co-inventors
47Inventor score
Filing activity: Jun 6, 1995 → Dec 22, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5771094A | Film measurement system with improved calibration | Physics | 115 | Expired |
| US5581350A | Method and system for calibrating an ellipsometer | Physics | 115 | Expired |
| US7190441B1 | Methods and systems for preparing a sample for thin film analysis | Electricity | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.