Inventor · Shanghai, CN

Jiamin Lei

2Patents
1h-index
5Co-inventors
27Inventor score

Filing activity: Jul 2, 2020 → Mar 18, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
USD1034255S1 Inspection device General 3 Active
US11579120B2 Colored defect detection curves Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.