Inventor · Verona, WI, US

John Charles Viner

21Patents
11h-index
8Co-inventors
64Inventor score

Filing activity: Feb 12, 1998 → Oct 26, 2007

Most-cited inventions

PatentTitleAreaCited byStatus
US6220510A Multi-application IC card with delegation feature Physics 181 Expired
US6439455B1 Value transfer system Physics 93 Expired
US6230267A IC card transportation key set Physics 75 Expired
US6366894B1 Value transfer system Physics 41 Expired
US6317832A Secure multiple application card system and process Electricity 32 Expired
US6575372B1 Secure multi-application IC card system having selective loading and deleting capability Physics 32 Expired
US6328217A Integrated circuit card with application history list Physics 24 Expired
US6488211B1 System and method for flexibly loading in IC card Physics 18 Expired
US6659354B2 Secure multi-application IC card system having selective loading and deleting capability Physics 17 Expired
US6742715B2 System and method for flexibly loading an IC card Physics 12 Expired
US7250870B1 Back draft alarm assembly for combustion heating device Mechanical Engineering; Lighting; Heating 11 Expired
US7730312B2 Tamper resistant module certification authority Electricity 9 Active
US7734923B2 Key transformation unit for a tamper resistant module Electricity 6 Active
US7730311B2 Key transformation unit for a tamper resistant module Electricity 5 Active
US7469339B2 Secure multiple application card system and process Electricity 5 Expired
US7669055B2 Key transformation unit for a tamper resistant module Electricity 5 Active
US7730310B2 Key transformation unit for a tamper resistant module Electricity 4 Active
US7707408B2 Key transformation unit for a tamper resistant module Electricity 4 Active
US7689826B2 Flexibly loading a tamper resistant module Electricity 3 Active
US7584358B2 Tamper resistant module certification authority Electricity 3 Active
US7702908B2 Tamper resistant module certification authority Electricity 3 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.