John E. Stephan
2Patents
2h-index
9Co-inventors
33Inventor score
Filing activity: Mar 9, 1998 → Mar 24, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6157450A | Automated optical surface profile measurement system | Physics | 28 | Expired |
| US7283256B2 | Method and apparatus for measuring wafer thickness | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.