John Hanselman
3Patents
3h-index
4Co-inventors
36Inventor score
Filing activity: Jan 15, 1997 → May 11, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6081330A | Method and device for measuring the thickness of opaque and transparent films | Physics | 74 | Expired |
| US5812261A | Method and device for measuring the thickness of opaque and transparent films | Physics | 72 | Expired |
| US6348967B1 | Method and device for measuring the thickness of opaque and transparent films | Physics | 54 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.