Inventor · Fontenay-aux-Roses, FR

John-Pierre Rey

1Patents
1h-index
6Co-inventors
25Inventor score

Filing activity: Feb 11, 1999 → Feb 11, 1999

Most-cited inventions

PatentTitleAreaCited byStatus
US6734967B1 Focused beam spectroscopic ellipsometry method and system Physics 103 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.