Jon Rowlan Shumate
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Oct 8, 1996 → Oct 8, 1996
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6219442A | Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.