Jonathan L. Kramer
4Patents
4h-index
6Co-inventors
43Inventor score
Filing activity: Nov 22, 1976 → Jul 21, 1988
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4146834A | Admittance measuring system for monitoring the condition of materials | Physics | 33 | Expired |
| US4723122A | Remotely calibratable instrument system | Physics | 22 | Expired |
| US4950998A | Continuous condition sensing system | Physics | 12 | Expired |
| US4849754A | Remotely calibratable instrument system | Physics | 10 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.