Jonathan Op de Beeck
1Patents
0h-index
3Co-inventors
19Inventor score
Filing activity: Sep 23, 2019 → Sep 23, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11549963B2 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.