Inventor · Seoul, KR

Jong Muk LEE

8Patents
1h-index
8Co-inventors
36Inventor score

Filing activity: Jun 9, 2016 → Mar 1, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US11112301B2 Method for correcting optical sensor array module through characteristic evaluation Physics 5 Active
US11624899B2 Device for analyzing large-area sample based on image, device for analyzing sample based on image by using difference in medium characteristic, and method for measuring and analyzing sample using the same Physics 0 Active
US12159473B2 Device for analyzing large-area sample based on image, device for analyzing sample based on image by using difference in medium characteristic, and method for measuring and analyzing sample using the same Physics 0 Active
US11680850B2 Method for correcting optical sensor array module through characteristic evaluation Physics 0 Active
US11879845B2 Fluorescence filter and image sensor module including same Physics 0 Active
US12158410B2 Real-time quantification method of cell viability through supravital dye uptake using lens-free imaging system Physics 0 Active
US12152979B2 Image sensor package, system, and method for counting fine particles by using virtual grid line Physics 0 Active
US11137335B2 Method for evaluating fluid flow characteristics of lens-free CMOS optical array sensor package module having flow channel Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.