Jongcheon Sun
1Patents
0h-index
5Co-inventors
19Inventor score
Filing activity: May 30, 2023 → May 30, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12352808B2 | Substrate inspection apparatus and substrate inspection method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.