Joseph Nicholas Kochey
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Jul 27, 2005 → Jul 27, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7202691B2 | Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers | Physics | 23 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.