Kaiwei Wang
4Patents
1h-index
11Co-inventors
41Inventor score
Filing activity: Jun 14, 2007 → Dec 6, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9448057B2 | Surface characteristic determining apparatus | Physics | 2 | Active |
| US8077324B2 | Surface characteristic determining apparatus | Physics | 1 | Active |
| US11882681B2 | Electromagnetic shielding structure and manufacturing method thereof, and electronic device | Electricity | 0 | Active |
| US9062959B2 | Wavelength scanning interferometer and method for aspheric surface measurement | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.