Inventor · Kariya, JP

Kazuhiro NIIMURA

1Patents
1h-index
7Co-inventors
25Inventor score

Filing activity: Jun 30, 2014 → Jun 30, 2014

Most-cited inventions

PatentTitleAreaCited byStatus
US9766292B2 Abnormality diagnostic device and abnormality diagnostic method for MOSFET switch element Emerging Cross-Sectional Technologies 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.