Inventor · Dix Hills, NY, US

Kefei Lu

2Patents
2h-index
8Co-inventors
27Inventor score

Filing activity: Sep 13, 2002 → Aug 1, 2003

Most-cited inventions

PatentTitleAreaCited byStatus
US6995762B1 Measurement of dimensions of solid objects from two-dimensional image(s) Physics 161 Expired
US7044378B2 System and method for imaging and decoding optical codes using at least two different imaging settings Physics 86 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.