Ken Katano
1Patents
0h-index
1Co-inventors
16Inventor score
Filing activity: Aug 7, 2019 → Aug 7, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10746812B2 | Semiconductor device, electronic circuit, and method of inspecting semiconductor device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.