Kyoko Minowa
1Patents
1h-index
7Co-inventors
25Inventor score
Filing activity: Sep 29, 1998 → Sep 29, 1998
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6226079A | Defect assessing apparatus and method, and semiconductor manufacturing method | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.