Lee Nino
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Mar 11, 2004 → Mar 11, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6862234B2 | Method and test circuit for testing a dynamic memory circuit | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.