Li-Chun Hsien
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Apr 22, 1999 → Apr 22, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6117780A | Chemical mechanical polishing method with in-line thickness detection | Electricity | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.