Linzhi Lu
1Patents
0h-index
2Co-inventors
16Inventor score
Filing activity: Dec 20, 2021 → Dec 20, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11906577B2 | Pad structure and testkey structure and testing method for semiconductor device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.