Lisa H Chan
1Patents
0h-index
4Co-inventors
19Inventor score
Filing activity: Jan 22, 2013 → Jan 22, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8835842B2 | Systems and methods for investigating a characteristic of a material using electron microscopy | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.