Makoto Okuno
4Patents
1h-index
7Co-inventors
37Inventor score
Filing activity: Nov 5, 2002 → Feb 13, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6837109B2 | Material thickness measurement method and apparatus | Physics | 17 | Expired |
| US12181851B2 | Settings information generation device, settings information generation method, and recording medium | Physics | 0 | Active |
| US10461997B2 | Information processing device and program | Physics | 0 | Active |
| US10789187B2 | I/O management apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.