Mark C. Carbone
19Patents
10h-index
14Co-inventors
69Inventor score
Filing activity: Jul 14, 1999 → Nov 29, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6340895B1 | Wafer-level burn-in and test cartridge | Physics | 131 | Expired |
| US6580283B1 | Wafer level burn-in and test methods | Physics | 92 | Expired |
| US8506335B2 | Apparatus for testing electronic devices | Physics | 29 | Active |
| US8628336B2 | Apparatus for testing electronic devices | Physics | 23 | Active |
| US6413113B2 | Kinematic coupling | Physics | 18 | Expired |
| US9316683B2 | Apparatus for testing electronic devices | Physics | 17 | Active |
| US7088117B2 | Wafer burn-in and test employing detachable cartridge | Physics | 13 | Expired |
| US8118618B2 | Apparatus for testing electronic devices | Physics | 11 | Active |
| US8388357B2 | Apparatus for testing electronic devices | Physics | 10 | Active |
| US11255903B2 | Apparatus for testing electronic devices | Physics | 10 | Active |
| US6556032B2 | Wafer-burn-in and test employing detachable cartridge | Physics | 6 | Expired |
| US9151797B2 | Apparatus for testing electronic devices | Physics | 1 | Active |
| US7541822B2 | Wafer burn-in and text employing detachable cartridge | Physics | 1 | Expired |
| US8747123B2 | Apparatus for testing electronic devices | Physics | 1 | Active |
| US12163999B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
| US6217367A | Kinematic coupling | General | 0 | Revoked |
| US10852347B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
| US10094872B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
| US11860221B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.