Masao Tanehashi
5Patents
4h-index
7Co-inventors
39Inventor score
Filing activity: Oct 30, 1998 → Jun 22, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6281691A | Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable | Emerging Cross-Sectional Technologies | 106 | Expired |
| US6400168B2 | Method for fabricating probe tip portion composed by coaxial cable | Emerging Cross-Sectional Technologies | 105 | Expired |
| US6310483A | Longitudinal type high frequency probe for narrow pitched electrodes | Physics | 104 | Expired |
| US6242930A | High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable | Physics | 17 | Expired |
| US6229321A | Process for manufacturing high frequency multichip module enabling independent test of bare chip | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.