Michael John DeCello
3Patents
3h-index
7Co-inventors
43Inventor score
Filing activity: Dec 22, 1988 → Mar 26, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5091647A | Method and apparatus for measuring the thickness of a layer on a substrate | Physics | 48 | Expired |
| US5117370A | Detection system for chemical analysis of zinc phosphate coating solutions | Physics | 10 | Expired |
| US6387303B1 | Method for forming a seal between mating components | Emerging Cross-Sectional Technologies | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.