Inventor · Eppelheim, DE

Michael Roehle

2Patents
2h-index
2Co-inventors
27Inventor score

Filing activity: Dec 21, 2010 → Mar 12, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US8745492B2 Determining event patterns for monitored applications Physics 3 Active
US8745491B2 Determining event patterns for monitored applications Physics 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.