Millard G. Mier
2Patents
2h-index
5Co-inventors
33Inventor score
Filing activity: Dec 20, 1989 → Mar 6, 1995
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5008542A | Method and system for automated measurement of whole-wafer etch pit density in GaAs | Physics | 10 | Expired |
| US5512999A | Method for nondestructive measurement of dislocation density in GaAs | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.