Mingying Ma
1Patents
0h-index
2Co-inventors
16Inventor score
Filing activity: Dec 25, 2006 → Dec 25, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8035801B2 | Method for in-situ aberration measurement of optical imaging system in lithographic tools | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.