Moshe Beylin
1Patents
1h-index
7Co-inventors
25Inventor score
Filing activity: Sep 12, 2008 → Sep 12, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7649978B2 | Automated selection of X-ray reflectometry measurement locations | Physics | 5 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.