Muhammad Nagi
1Patents
0h-index
6Co-inventors
19Inventor score
Filing activity: Nov 20, 2017 → Nov 20, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10782342B2 | Integrated optical probe card and system for batch testing of optical MEMS structures with in-plane optical axis using micro-optical bench components | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.