Norm Boling
1Patents
0h-index
2Co-inventors
16Inventor score
Filing activity: Jan 18, 2005 → Jan 18, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7008518B2 | Method and apparatus for monitoring optical characteristics of thin films in a deposition process | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.