Oded Kaminsky
2Patents
1h-index
24Co-inventors
34Inventor score
Filing activity: Jun 30, 2016 → Aug 4, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10831108B2 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Electricity | 2 | Active |
| US10197922B2 | Focus metrology and targets which utilize transformations based on aerial images of the targets | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.