Patricia Le Coupanec
5Patents
4h-index
11Co-inventors
46Inventor score
Filing activity: Feb 19, 2002 → Apr 25, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7439730B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 7 | Expired |
| US7113630B2 | PICA system detector calibration | Physics | 5 | Expired |
| US7323862B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 4 | Expired |
| US7115426B2 | Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate | Electricity | 4 | Expired |
| US7038442B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.