Patrick M. Maxton
5Patents
5h-index
11Co-inventors
52Inventor score
Filing activity: Apr 22, 1999 → Dec 22, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6734968B1 | System for analyzing surface characteristics with self-calibrating capability | Physics | 73 | Expired |
| US6804003B1 | System for analyzing surface characteristics with self-calibrating capability | Physics | 59 | Expired |
| US7253901B2 | Laser-based cleaning device for film analysis tool | Physics | 13 | Expired |
| US7190441B1 | Methods and systems for preparing a sample for thin film analysis | Electricity | 6 | Expired |
| US7202951B1 | Laser-based cleaning device for film analysis tool | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.