Inventor · Sunnyvale, CA, US

Patrick Mihelich

5Patents
2h-index
15Co-inventors
40Inventor score

Filing activity: Dec 27, 2013 → Mar 16, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US10275945B2 Measuring dimension of object through visual odometry Physics 2 Active
US9631956B2 Methods and systems for calibrating sensors of a computing device Electricity 2 Active
US9405734B2 Image manipulation for web content Physics 1 Active
US11195049B2 Electronic device localization based on imagery Physics 1 Active
US9953243B2 Electronic device localization based on imagery Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.