Patrick Veya
14Patents
3h-index
29Co-inventors
60Inventor score
Filing activity: Jul 31, 1997 → Jun 8, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7381758B2 | Ink composition comprising optically variable pigments, use of the composition, optically variable pigment and method of treating said pigment | Emerging Cross-Sectional Technologies | 18 | Expired |
| US6160046A | Abrasion-removable coating and method of application | Chemistry; Metallurgy | 12 | Expired |
| US6787583B2 | UV curing intaglio ink | Emerging Cross-Sectional Technologies | 8 | Expired |
| US10391806B2 | Permanent staining of varnished security documents | Emerging Cross-Sectional Technologies | 2 | Active |
| US8303700B1 | Coating composition for producing magnetically induced | Chemistry; Metallurgy | 1 | Active |
| US12054619B2 | UV-Vis radiation curable security inks for producing dichroic security features | Chemistry; Metallurgy | 1 | Active |
| US8246735B2 | Coating composition for producing magnetically induced images | Chemistry; Metallurgy | 1 | Active |
| US12043047B2 | Process for producing dichroic security features for securing value documents | Performing Operations; Transporting | 0 | Active |
| US12215242B2 | UV-VIS radiation curable security inks for producing dichroic security features | Chemistry; Metallurgy | 0 | Active |
| US11712917B2 | Security document and manufacturing method thereof | Performing Operations; Transporting | 0 | Active |
| US12391841B2 | Hybrid UV-LED radiation curable protective varnishes for security documents | Chemistry; Metallurgy | 0 | Active |
| US8540813B2 | Intaglio printing ink comprising dendrimers | Chemistry; Metallurgy | 0 | Active |
| US12115808B2 | UV-Vis radiation radically curable security inks | Chemistry; Metallurgy | 0 | Active |
| US12311406B2 | Methods for producing optical effect layers comprising magnetic or magnetizable pigment particles and exhibiting one or more indicia | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.