Peter J. Vigil
2Patents
2h-index
5Co-inventors
27Inventor score
Filing activity: May 14, 1996 → Apr 4, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5732209A | Self-testing multi-processor die with internal compare points | Physics | 182 | Expired |
| US5951702A | RAM-like test structure superimposed over rows of macrocells with added differential pass transistors in a CPU | Physics | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.