Inventor · Limeshain, DE

Peter Kappel

1Patents
1h-index
7Co-inventors
25Inventor score

Filing activity: Aug 1, 1996 → Aug 1, 1996

Most-cited inventions

PatentTitleAreaCited byStatus
US5764352A Process and apparatus for spectral reflectance and transmission measurements Physics 6 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.