Peter Nunan
1Patents
1h-index
6Co-inventors
25Inventor score
Filing activity: Aug 29, 2005 → Aug 29, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7304302B1 | Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysis | Electricity | 41 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.