Peter Schaeffler
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Feb 11, 2010 → Feb 11, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8532364B2 | Apparatus and method for detecting defects in wafer manufacturing | Physics | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.